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1

An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications

Maricau, E., De Wit, P., Gielen, G.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 208 KB

english, 2008

2

Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis

Maricau, E., Gielen, G.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2010

Language:

english

File:

PDF, 586 KB

english, 2010

3

[IEEE 2012 IEEE Custom Integrated Circuits Conference - CICC 2012 - San Jose, CA, USA (2012.09.9-2012.09.12)] Proceedings of the IEEE 2012 Custom Integrated Circuits Conference - Designing reliable analog circuits in an unreliable world

Gielen, Georges G. E., Maricau, Elie, De Wit, Pieter

Year:

2012

Language:

english

File:

PDF, 387 KB

english, 2012

4

[IEEE ESSDERC 2011 - 41st European Solid State Device Research Conference - Helsinki, Finland (2011.09.12-2011.09.16)] 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - A compact NBTI model for accurate analog integrated circuit reliability simulation

Maricau, Elie, Zhang, Leqi, Franco, Jacopo, Roussel, Philippe, Groeseneken, Guido, Gielen, Georges

Year:

2011

Language:

english

File:

PDF, 350 KB

english, 2011

5

Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS

Maricau, E., Gielen, G.

Journal:

IEEE Journal on Emerging and Selected Topics in Circuits and Systems

Year:

2011

Language:

english

File:

PDF, 1.15 MB

english, 2011

6

[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Advances in variation-aware modeling, verification, and testing of analog ICs

De Jonghe, Dimitri, Maricau, E., Gielen, G., McConaghy, T., Tasic, B., Stratigopoulos, H.

Year:

2012

Language:

english

File:

PDF, 709 KB

english, 2012

7

Analog IC Reliability in Nanometer CMOS || Introduction

Maricau, Elie, Gielen, Georges

Year:

2013

Language:

english

File:

PDF, 662 KB

english, 2013

8

Analog IC Reliability in Nanometer CMOS || CMOS Reliability Overview

Maricau, Elie, Gielen, Georges

Year:

2013

Language:

english

File:

PDF, 731 KB

english, 2013

9

Analog IC Reliability in Nanometer CMOS || Analog IC Reliability Simulation

Maricau, Elie, Gielen, Georges

Year:

2013

Language:

english

File:

PDF, 1.87 MB

english, 2013

10

Analog IC Reliability in Nanometer CMOS || Integrated Circuit Reliability

Maricau, Elie, Gielen, Georges

Year:

2013

Language:

english

File:

PDF, 1.12 MB

english, 2013

11

Analog IC Reliability in Nanometer CMOS || Background on IC Reliability Simulation

Maricau, Elie, Gielen, Georges

Year:

2013

Language:

english

File:

PDF, 389 KB

english, 2013

12

Analog IC Reliability in Nanometer CMOS || Transistor Aging Compact Modeling

Maricau, Elie, Gielen, Georges

Year:

2013

Language:

english

File:

PDF, 1.02 MB

english, 2013

13

Analog IC Reliability in Nanometer CMOS ||

Maricau, Elie, Gielen, Georges

Year:

2013

Language:

english

File:

PDF, 5.87 MB

english, 2013

14

NBTI model for analogue IC reliability simulation

Maricau, E., Gielen, G.

Journal:

Electronics Letters

Year:

2010

Language:

english

File:

PDF, 157 KB

english, 2010

15

[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Hierarchical analog circuit reliability analysis using multivariate nonlinear regression and active learning sample selection

Maricau, E., De Jonghe, Dimitri, Gielen, G.

Year:

2012

Language:

english

File:

PDF, 982 KB

english, 2012

16

[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - A methodology for measuring transistor ageing effects towards accurate reliability simulation

Maricau, Elie, Gielen, Georges

Year:

2009

Language:

english

File:

PDF, 267 KB

english, 2009

17

[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Stochastic Degradation Modeling and Simulation for Analog Integrated Circuits in Nanometer CMOS

Gielen, Georges, Maricau, Elie

Year:

2013

Language:

english

File:

PDF, 655 KB

english, 2013

18

[IEEE ESSCIRC 2011 - 37th European Solid State Circuits Conference - Helsinki, Finland (2011.09.12-2011.09.16)] 2011 Proceedings of the ESSCIRC (ESSCIRC) - Transistor aging-induced degradation of analog circuits: Impact analysis and design guidelines

Maricau, Elie, Gielen, Georges

Year:

2011

Language:

english

File:

PDF, 421 KB

english, 2011

19

[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?

Chatterjee, Abhijit, Abraham, Jacob, Singh, Adit, Maricau, Elie, Kumar, Rakesh, Papachristou, Christos

Year:

2009

Language:

english

File:

PDF, 63 KB

english, 2009

20

[IEEE 2012 19th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2012) - Seville, Seville, Spain (2012.12.9-2012.12.12)] 2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012) - Offset measurement method for accurate characterization of BTI-induced degradation in opamps

Mahato, Swaraj, De Wit, Pieter, Maricau, Elie, Gielen, Georges

Year:

2012

Language:

english

File:

PDF, 428 KB

english, 2012

21

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

Gielen, G., De Wit, P., Maricau, E., Loeckx, J., Martin-Martinez, J., Kaczer, B., Groeseneken, G., Rodriguez, R., Nafria, M.

Year:

2008

Language:

english

File:

PDF, 409 KB

english, 2008

22

[IEEE 2011 18th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2011) - Beirut, Lebanon (2011.12.11-2011.12.14)] 2011 18th IEEE International Conference on Electronics, Circuits, and Systems - Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS

Vanden Bussche, Simon, De Wit, Pieter, Maricau, Elie, Gielen, Georges

Year:

2011

Language:

english

File:

PDF, 627 KB

english, 2011

23

[IEEE 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE'09) - Nice (2009.04.20-2009.04.24)] 2009 Design, Automation & Test in Europe Conference & Exhibition - Efficient reliability simulation of analog ICs including variability and time-varying stress

Maricau, E., Gielen, G.

Year:

2009

Language:

english

File:

PDF, 184 KB

english, 2009

24

[IEEE 2011 Design, Automation & Test in Europe - Grenoble (2011.03.14-2011.03.18)] 2011 Design, Automation & Test in Europe - Stochastic circuit reliability analysis

Maricau, E, Gielen, G

Year:

2011

Language:

english

File:

PDF, 455 KB

english, 2011

25

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Variability-aware reliability simulation of mixed-signal ICs with quasi-linear complexity

Maricau, Elie, Gielen, Georges

Year:

2010

Language:

english

File:

PDF, 373 KB

english, 2010

26

[IEEE 2011 Design, Automation & Test in Europe - Grenoble (2011.03.14-2011.03.18)] 2011 Design, Automation & Test in Europe - Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation

Gielen, G, Maricau, E, De Wit, P

Year:

2011

Language:

english

File:

PDF, 268 KB

english, 2011

27

[IEEE 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2010.11.7-2010.11.11)] 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Design automation towards reliable analog integrated circuits

Gielen, Georges, Maricau, Elie, De Wit, Pieter

Year:

2010

Language:

english

File:

PDF, 197 KB

english, 2010

28

[ACM Press the conference - Munich, Germany (2008.03.10-2008.03.14)] Proceedings of the conference on Design, automation and test in Europe - DATE '08 - Emerging yield and reliability challenges in nanometer CMOS technologies

Gielen, G., De Wit, P., Maricau, E., Loeckx, J., Martín-Martínez, J., Kaczer, B., Groeseneken, G., Rodríguez, R., Nafría, M.

Year:

2008

Language:

english

File:

PDF, 358 KB

english, 2008

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